Maryland's Defense Patent Database

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Particle detector

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A particle detection device and method wherein a bulk sample of particles is selectively collected based on scattering properties of the particles and fluorescence properties of the particles. The bulk sample of particles is then excited to produce an atomic emission from the bulk sample of particles. The atomic emission from the bulk sample of particles is used to determine atomic emission properties of the particles and identify biological particles in the bulk sample.

Inventors: 
Sickenberger, David W.; Foot, Virginia E.; Payne, Dean
Patent Number: 
Technical domain: 
Sensors and Measurement
FIle Date: 
2007-10-04
Grant Date: 
2010-12-14
Grant time: 
1,167 days
Grant time percentile rank: 
21
Claim count percentile rank: 
7
Citations percentile rank: 
1
'Cited by' percentile rank: 
1
Assignee: 
UNITED STATES OF AMERICA