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Systems for measuring backscattered light using rotating mirror

Patent image
ARL

A system for measuring backscattered light from a sample is given. Light is output from a light source towards a rotating mirror, and then reflected by the rotating mirror towards the sample. The sample reflects backscattered light back towards the rotating mirror, which, having moved during the time it took for the light to propagate from the mirror to the sample and back, reflects the backscattered light to a detector located at a physical separation from the light source. The detected backscattered light may be analyzed to determine various properties of the sample.

Inventors: 
Videen, Gorden W.; Muinonen, Karri Olavi
Patent Number: 
Technical domain: 
Sensors and Measurement
FIle Date: 
2008-09-17
Grant Date: 
2011-04-05
Grant time: 
930 days
Grant time percentile rank: 
17
Claim count percentile rank: 
2
Citations percentile rank: 
2
'Cited by' percentile rank: 
1
Assignee: 
US ARMY